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International Journal of Nanoscience cover

Volume 02, Issue 04n05 (August & October 2003)

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
MANIPULATION OF ATOMS AND MOLECULES FOR CONSTRUCTION OF NANOSYSTEMS: THE SCANNING TUNNELING MICROSCOPE AS AN OPERATIVE TOOL
  • Pages:197–218

https://doi.org/10.1142/S0219581X03001218

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
UTILIZING THE COULOMB FORCE ON A CARBON NANOTUBE TO ENHANCE THE RESOLUTION OF ELECTROSTATIC FORCE MICROSCOPE
  • Pages:219–224

https://doi.org/10.1142/S0219581X0300122X

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
DESIGN AND CONSTRUCTION OF A SHORT-TIP TAPPING-MODE TUNING FORK NEAR-FIELD SCANNING OPTICAL MICROSCOPE
  • Pages:225–230

https://doi.org/10.1142/S0219581X03001231

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
SYNTHESIS OF NANOSTRUCTURE CARBONACEOUS MATERIALS ON TIP USING PLASMA-CHEMICAL-VAPOR-DEPOSITION METHOD
  • Pages:231–237

https://doi.org/10.1142/S0219581X03001243

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
FORMATION OF SELF-ASSEMBLED MONOLAYERS ON GOLD SURFACES BY LUMINESCENT OLIGO (PARA-PHENYLENE-VINYLENE)-METHANETHIOL
  • Pages:239–244

https://doi.org/10.1142/S0219581X03001255

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
CONDUCTIVITY CHARACTERIZATION USING STM OF POLYPYRROLE ULTRATHIN FILMS PREPARED FROM ADMICELLAR POLYMERIZATION
  • Pages:245–255

https://doi.org/10.1142/S0219581X03001267

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
SYNTHESIS AND ORGANIZATION OF II–VI LOW DIMENSION NANOMATERIALS IN NONIONIC AMPHIPHILIC TRIBLOCK COPOLYMER SYSTEMS
  • Pages:257–263

https://doi.org/10.1142/S0219581X03001279

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
OPTICAL PROPERTIES OF POPULATED InAs/GaAs QUANTUM DOTS
  • Pages:265–269

https://doi.org/10.1142/S0219581X03001280

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
ELECTRO-DISCHARGE METHOD TO MANUFACTURE SUPERPARAMAGNETIC IRON OXIDE NANOPARTICLES
  • Pages:271–282

https://doi.org/10.1142/S0219581X03001292

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
FABRICATION OF NEARFIELD OPTICAL PROBE ARRAY USING VARIOUS NANOFABRICATION PROCEDURES
  • Pages:283–291

https://doi.org/10.1142/S0219581X03001309

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
NANOTUBE TIP FOR STM
  • Pages:293–298

https://doi.org/10.1142/S0219581X03001310

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
NANOSTRUCTURED SnO2/C COMPOSITE ANODES IN LITHIUM-ION BATTERIES
  • Pages:299–306

https://doi.org/10.1142/S0219581X03001322

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
ELECTROCHEMICAL STORAGE OF HYDROGEN IN CARBON NANOSTRUCTURES
  • Pages:307–317

https://doi.org/10.1142/S0219581X03001334

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
He INCORPORATION INTO SMALL CAGE COMPOUNDS: A COMPUTATIONAL STUDY
  • Pages:319–324

https://doi.org/10.1142/S0219581X03001346

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
MAGNETIC FORCE MICROSCOPY STUDY IN PATTERNED PERMALLOY SUBMICRON-WIRES
  • Pages:325–333

https://doi.org/10.1142/S0219581X03001358

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
PITCH MEASUREMENT BY TRACEABLE ATOMIC FORCE MICROSCOPE
  • Pages:335–341

https://doi.org/10.1142/S0219581X0300136X

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
A COMPARISON BETWEEN THE ATOMIC FORCE MICROSCOPY AND X-RAY REFLECTIVITY ON THE CHARACTERIZATION OF SURFACE ROUGHNESS
  • Pages:343–348

https://doi.org/10.1142/S0219581X03001371

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
SCANNING PROBE ANALYSIS OF DEFECTS INDUCED BY SLIGHT IRON CONTAMINATION ON THERMALLY OXIDIZED p-TYPE SILICON WAFERS
  • Pages:349–355

https://doi.org/10.1142/S0219581X03001383

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
DETERMINE THE SIZE AND OXIDIZATION OF SILICON QUANTUM DOTS PREPARED BY THERMAL EVAPORATION METHOD
  • Pages:357–362

https://doi.org/10.1142/S0219581X03001395

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
RESONANCE BAND IN Ge/Si SUPERLATTICE STUDIED BY RAMAN SCATTERING
  • Pages:363–368

https://doi.org/10.1142/S0219581X03001401

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
ELECTROREFLECTANCE CHARACTERIZATION OF THE Ge/Si GROOVE ISLAND STRUCTURES
  • Pages:369–373

https://doi.org/10.1142/S0219581X03001413

SPECIAL ISSUE ON THE FOURTH ASIA CONFERENCE ON SCANNING PROBE MICROSCOPY (ASIA SPM4) AND THE FIRST TAIPEI SYMPOSIUM ON NANOTECHNOLOGY; EDITED BY T. T. TSONG. C. S. CHANG, K. H. CHEN, and S. GWO
No Access
FABRICATION AND MODELING OF MICROCHANNEL MILLING USING FOCUSED ION BEAM
  • Pages:375–379

https://doi.org/10.1142/S0219581X03001425