SEMINAR ON “MULTILAYERS”

The main issues for discussion were presented. They included topics such as the morphology and roughness of multilayer interfaces and their correlation with the performance of multilayers as devices; the characterization of interface roughness and morphology into specular and off-specular neutron and X-ray scattering; the issue of magnetic roughness at magnetic interfaces and its determination by neutron and X-ray scattering; the study of epitaxy and crystallinity of multilayers by neutron and X-ray diffraction; growth of multilayers for optimum performances; the study of novel physical properties of artificially structural materials created by juxtaposing magnetic, superconducting or semiconducting layers; and applications of multilayers as monchromators and supermirrors, in soft X-ray astronomy and as devices…