RF MOS MEASUREMENTS
The following sections are included:
Characterizing Devices From DC To High Frequencies
DC Measurements As A Prerequisite For RF Setups
Capacitance Measurements At 1MHz
From Y-, Z-, And H-Parameters To S-Parameters
Introducing S-Parameters
Smith Chart And Polar Plot
Useful Notes On S-Parameter Properties
Multiport S-Parameters
Calculating S-Parameters From Complex Voltages
Network Analyzer Measurements
Network Analyzer Measurement Principle
Network Analyzer With DC Bias
Network Analyzer Calibration
NWA Calibration Verification
Conditions For Efficient NWA Measurements
Linear Versus Non-Linear RF Performance
Pulsed S-Parameter Measurements
Extending The Measurement Plane To The Transistor: De-embedding
A De-Embedding Tutorial
Two-Port Matrix Properties And Manipulations For De-Embedding
De-embedding Techniques
De-Embedding The OPEN Dummy Device
De-embedding The OPEN And The SHORT Dummy Device
Verifying The De-Embedding
Over- And Under-De-Embedding
Checking RF Measurement Data Consistency
Test Structures For MOS Transistors
Pad Layout Suggestions For A Uniform DC And S-Parameter Test Stucture
Layout For High Frequency MOS Transistors
Additional dummy structures for de-embedding
Conclusions
References
