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Optoelectronic Device Reliability

      https://doi.org/10.1142/9789814277112_0007Cited by:0 (Source: Crossref)
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      Abstract:

      The following sections are included:

      • Basic Considerations

        • Material properties

          • AlGaAs and GaAs

          • InGaAsP and InGaAs

          • AlGaInP

          • GaAsP

          • AlGaInN

          • InGaN

        • Operating conditions and failure definitions

          • Light-emitting diodes

          • Laser diodes

      • Reliability of Light-Emitting Diodes

        • General characteristics

        • Mechanisms

      • Laser Diode Reliability

        • General characteristics

        • Dark-Line Defects

        • Catastrophic optical damage

        • Facet damage

        • Electrode damage

        • Reliability evaluation

      • VCSELs

      • Tunable and Frequency Stabilized Lasers

        • Tunable lasers

        • Frequency-stabilized lasers

      • Optical Detectors

        • Conventional detectors

        • Avalanche photodetectors

      • Summary

      • References