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DELAYED COINCIDENCE METHOD FOR PICOSECOND LIFETIME MEASUREMENTS

    https://doi.org/10.1142/9789814447485_0058Cited by:0 (Source: Crossref)
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    Abstract:

    The advanced time delay (ATD) technique, based by delayed coincidence method, and other derived techniques are widely used for short lifetime measurements. This paper presents the principle of the ATD technique, the crucial factors which affect the timing performance of a fast timing setup, and the optimizations of them.

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