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PROTON INDUCED X-RAY EMISSION ANALYSIS OF TRACE ELEMENTS IN THICK BREAD SAMPLES

MOHAMED BAKER AL-BEDRI

Radiography Department, Faculty of Allied Health Sciences, Hashemite University, P.O. Box 330058, Zarqa 13133, Jordan

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IKRAM JAMEEL ABDUL GHANI

Physics Department, Faculty of Education/Ibn Al-Haitham, Baghdad University, A'adamya, Baghdad, Iraq

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, and

IBRAHIM ABDUL RAHMAN AL-AGHIL

Physics Department, Faculty of Science, King Saud University, P.O. Box 2455, Riyadh 11451, Saudia Arabia

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https://doi.org/10.1142/S0129083509001825Cited by:1 (Source: Crossref)

Abstract

Proton induced X-ray emission (PIXE) technique has been used for identification and quantitative analysis of the elemental concentration in thick bread samples. Bread samples were air-oven dried at 60 oC and milled in a clean agate mortar to homogenize the sample and pressed into a pellet. PIXE technique relies on the analysis of the energy spectra of the characteristic X-ray emitted from the thick bread sample and the orchard leaf standard (NIST- SRM -1571) bombarded with 2.0 MeV protons. The concentration of the elements (Cl, K, Ca, Mn, Fe, Cu, and Zn) in the bread samples was determined by comparison with NIST orchard leaf standard. The accuracy of the measurements ranged between ± 2% and ± 10% for the most elements detected in this method. The aim of this study is to establish the reference concentration of trace elements in the Iraqi bread using PIXE technique.

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