SIMULTANEOUS PIXE ANALYSIS OF SOME ADJACENT ELEMENTS

There is often a need to determine simultaneously both elements of an adjacent elemental pair whose K_α and K_β X-rays cannot be adequately resolved by the detector. The extent to which specific adjacent elements (viz. K-Ca and V-Cr) mutually interfered with each other was studied by PIXE on thick and thin targets specially prepared from synthetic mixtures. To monitor the lowest relative concentration for which significant results can be obtained, the concentration of each element in each of the pairs studied was systematically changed.