MATRIX EFFECT ON S X-RAY PRODUCTION BY PROTONS AND Ar IONS

Thick targets of Li₂B₄O₇ containing different concentrations of S have been irradiated with 0.8 to 3.0 MeV protons and 1.0 to 5.0 MeV Ar ions and the K X-ray yields of the S and one projectile (Ar) measured. The K X-ray production cross sections deduced from the measured yields, show a strong dependence on the S concentration in the case of the Ar bombardments. This effect is interpreted as being a consequence of the double-scattering mechanism occurring in the Ar-S collision system.