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AN ATTEMPT TO SUPPRESS THE COMPTON SCATTERING BACKGROUND APPEARING IN THE PIXE SPECTRUM

T. SATOH

Department of Quantum Science and Energy Engineering, Tohoku University, Sendai 980-8579, Japan

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K. ISHII

Department of Quantum Science and Energy Engineering, Tohoku University, Sendai 980-8579, Japan

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S. MATSUYAMA

Department of Quantum Science and Energy Engineering, Tohoku University, Sendai 980-8579, Japan

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H. YAMAZAKI

Department of Quantum Science and Energy Engineering, Tohoku University, Sendai 980-8579, Japan

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K. YAMAMOTO

Department of Quantum Science and Energy Engineering, Tohoku University, Sendai 980-8579, Japan

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K. GOTOH

Department of Quantum Science and Energy Engineering, Tohoku University, Sendai 980-8579, Japan

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A. SUGIMOTO

Department of Quantum Science and Energy Engineering, Tohoku University, Sendai 980-8579, Japan

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Y. TOKAI

Department of Quantum Science and Energy Engineering, Tohoku University, Sendai 980-8579, Japan

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T. SASAKI

Department of Quantum Science and Energy Engineering, Tohoku University, Sendai 980-8579, Japan

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, and

M. OIKAWA

Department of Quantum Science and Energy Engineering, Tohoku University, Sendai 980-8579, Japan

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https://doi.org/10.1142/S0129083598000315Cited by:1 (Source: Crossref)

Abstract

The background due to the Compton scattering of γ-rays in a Si(Li) X-ray detector was measured with the coincidence system which consists of a Si(Li) X-ray detector and NaI(Tl) scintillation detector. The Si(Li) X-ray detector is a through type to detect γ-rays of the Compton scattering into the forward direction. The energy spectra of the Si(Li) detector were measured for γ-rays of 662 keV from a ¹³⁷Cs source. The contribution of recoiled electrons to the PIXE spectrum in the energy region of 0~100 keV was ~20 % of its background spectrum. It was not enough to suppress the Compton scattering background by using the present system.

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