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Research PapersNo Access

EFFECT OF Pr DOPING ON FERROELECTRIC BEHAVIORS OF Pb(Zr_0.65Ti_0.35)O₃

Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China

International Center for Materials Physics, Chinese Academy of Sciences, Shenyang, China

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Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China

International Center for Materials Physics, Chinese Academy of Sciences, Shenyang, China

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,

Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China

International Center for Materials Physics, Chinese Academy of Sciences, Shenyang, China

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,

Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China

International Center for Materials Physics, Chinese Academy of Sciences, Shenyang, China

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,

Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China

International Center for Materials Physics, Chinese Academy of Sciences, Shenyang, China

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, and

Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, China

International Center for Materials Physics, Chinese Academy of Sciences, Shenyang, China

Corresponding author.

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https://doi.org/10.1142/S0217979208039332Cited by:0 (Source: Crossref)

Abstract

Pr-doped Pb(Zr_0.65Ti_0.35)O₃ (Pb_1-xPr_x(Zr_0.65Ti_0.35)_1-x/4O₃, PPZT) ceramic samples are prepared using conventional solid-state sintering method, and their structural, dielectric, ferroelectric, and piezoelectric properties are investigated, focusing on the effects of Pr-doping. Upon increasing Pr doping level x, a transition of the crystallographic structure from rhombohedral symmetry to tetrahedral and finally to pseudocubic symmetry is observed at x ~ 0.08. The detailed dielectric measurements present a clear indication of relaxor-like behaviors at x = 0.08, while the samples at x < 0.08 offer slightly improved ferroelectric properties compared with pure Pb( Zr_0.65Ti_0.35)O₃. In spite of the dielectric relaxor behaviors induced by Pr-doping, both the ferroelectric and piezoelectric properties of PPZT are degraded at x = 0.08. The physics underlying the Pr-doping induced relaxor behaviors is then discussed.

Keywords:

PACS: 77.84.Dy, 77.22.Gm, 77.80.Bh, 77.22.-d, 77.80.-e, 77.65.Bn

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Vol. 22, No. 13

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Received 7 February 2007

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