Semiconductor HeterostructuresNo Access
SOME PECULIARITIES OF USING OF DIELECTRIC RESONATORS IN MICROWAVE SURFACE IMPEDANCE MEASUREMENTS
https://doi.org/10.1142/S0217979209063602Cited by:0 (Source: Crossref)
Abstract
A simple equivalent circuit of the dielectric resonator technique, using for measurement of the surface resistance of the samples of non-standard dimensions, was considered and analyzed. It was shown that the coefficient (the geometry factor) relating the surface resistance of the sample to the quality factor may be different in the cases when the inductive resistance (caused by the external inductance) of the sample exceeds significantly its active resistance and when these resistances are of the same order. It was shown too, that an anomaly in the RS versus T dependence (i.e., a decreasing of the surface resistance with increase of the temperature) is possible in double layer structures with thin superconductor and metal films.
| You currently do not have access to the full text article. |
|---|
