Raman spectroscopy, X-ray diffraction and electrical properties of fullerene-based poly (methylmethacrylate) polymers
Abstract
Fullerene grafted poly (methylmethacrylate) polymers have been studied using X-ray diffraction and raman spectroscopy to analyze their polymeric structure. The electrical properties of prepared polymers have also been studied. The X-ray diffraction and raman spectroscopy pattern of pure buckminster fullerene (C60) has been compared with prepared polymeric samples. Raman spectroscopy indicates that a structural change occurs due to grafting. The vibrations in the relative intensity of peaks and shifts in energy are observed. The lower scattering efficiency of pure fullerene (C60) is observed at 1468 cm-1.The values for poly (methylmethacrylate) are observed at 3000 cm-1. The result show a large shift in the intense raman spectral region of fullerene-based poly (methylmethacrylate) which lies between 2500 cm-1 and 3000 cm-1. X-ray diffraction shows an unusual variation in crystallite size of polymeric samples. Generally it has been observed that polymers are insulators, but noticeably fullerene-based poly (methylmethacrylate) show conducting behavior.
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