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Characterization tools of thin polymer films

Shenglin Zhou

Center for Soft Condensed Matter Physics and Interdisciplinary Research, Soochow University, Suzhou 215006, P. R. China

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Zhaohui Yang

Center for Soft Condensed Matter Physics and Interdisciplinary Research, Soochow University, Suzhou 215006, P. R. China

College of Physics, Optoelectronics and Energy, Soochow University, Suzhou 215006, P. R. China

E-mail Address: yangzhaohui@suda.edu.cn

Corresponding authors.

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Xiaohua Zhang

Center for Soft Condensed Matter Physics and Interdisciplinary Research, Soochow University, Suzhou 215006, P. R. China

College of Physics, Optoelectronics and Energy, Soochow University, Suzhou 215006, P. R. China

E-mail Address: zhangxiaohua@suda.edu.cn

Corresponding authors.

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https://doi.org/10.1142/S0217979218400076Cited by:0 (Source: Crossref)

This article is part of the issue:

SPECIAL ISSUE — Soft Matter; Guest Editors: Z.-C. Ouyang and X. Y. Liu

Abstract

Materials having nanoscale structures have shown potentials for applications in microelectronics, biomedicine and energy storage. A continuing challenge is the capability of fabricating multi-function nanodevices with controlled nanostructures and excellent performances. Measurement platforms, which provide accurate and detailed information on internal structures, surface morphologies, mechanical properties and electrochemical properties are a key to this challenge. In this review, we, in particular, highlight the crucial role of measurement techniques in quantifying these nanostructures and their properties.

Translated from Acta Physica Sinica (物理学报), 2016, 65(17): 178201. Please reference the original doi.org/10.7498/aps.65.178201 (高分子薄膜表征技术).

Keywords:

PACS: 68.35.bm, 68.35.Ct, 68.35.Rh

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