CHARACTERIZATION OF CHAOTICITY IN THE TRANSIENT CURRENT THROUGH PMMA THIN FILMS
Abstract
Chaotic behavior in the transient current through thin Aluminum-PMMA-Aluminum films has been analyzed for times ranging up to 30,000s, in the temperature range 293–363K for applied voltages in the range 10–80V. Time series analysis reveals a positive Lyapunov exponent consistently and reproducibly throughout this range. Power law relaxation as reflected by the autocorrelation function and the positive Lyapunov exponent show parallel behaviors as a function of applied electric field.