World Scientific
Skip main navigation

Cookies Notification

We use cookies on this site to enhance your user experience. By continuing to browse the site, you consent to the use of our cookies. Learn More
×

System Upgrade on Tue, May 28th, 2024 at 2am (EDT)

Existing users will be able to log into the site and access content. However, E-commerce and registration of new users may not be available for up to 12 hours.
For online purchase, please visit us again. Contact us at customercare@wspc.com for any enquiries.

FRACTAL N/MEMS: FROM PULL-IN INSTABILITY TO PULL-IN STABILITY

    https://doi.org/10.1142/S0218348X21500304Cited by:127 (Source: Crossref)

    Pull-in instability, as an inherent nonlinear problem, continues to become an increasingly important and interesting topic in the design of electrostatic Nano/Micro-electromechanical systems (N/MEMS) devices. Generally, the pull-in instability was studied in a continuous space, but when the electronic devices work in a porous medium, they need to be analyzed in a fractal partner. In this paper, we establish a fractal model for N/MEMS, and find a pull-in stability plateau, which can be controlled by the porous structure, and the pull-in instability can be finally converted to a stable condition. As a result, the pull-in instability can be completely eliminated, realizing the transformation of pull-in instability into pull-in stability.