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WAVE-BASED APPROACH FOR MICROWAVE NOISE CHARACTERIZATION

Department of Electrical and Computer Engineering, McMaster University, 1280 Main Street West, Hamilton, Ontario, L8S 4K1, Canada

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Y. L. WANG

Department of Electrical and Computer Engineering, McMaster University, 1280 Main Street West, Hamilton, Ontario, L8S 4K1, Canada

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, and

M. H. BAKR

Department of Electrical and Computer Engineering, McMaster University, 1280 Main Street West, Hamilton, Ontario, L8S 4K1, Canada

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https://doi.org/10.1142/S0219477508004313Cited by:1 (Source: Crossref)

Abstract

The noise behavior of a two-port is usually described through the conventional set of noise parameters F_min, R_n, and the complex Y_opt. However, noise parameters developed using wave-based techniques also have their merit as they could offer different insights to a two-port's noise behavior. Unlike the conventional noise parameters, these wave-based noise parameters could be terminal-invariant and describe only the intrinsic noise behavior of a two-port. In this paper, several important noise parameters derived from wave-based approaches are reviewed. The derivation of each set of parameters is discussed and illustrated. The measurement approach of each set of parameters is also briefly covered.

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