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Impedance spectroscopic and dielectric properties of nanosized Y_2/3Cu₃Ti₄O₁₂ ceramic

Department of Chemistry, Indian Institute of Technology, (Banaras Hindu University), Varanasi 221005, Uttar Pradesh, India

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Shiv Sundar Yadav

Department of Chemistry, Indian Institute of Technology, (Banaras Hindu University), Varanasi 221005, Uttar Pradesh, India

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M. M. Singh

Department of Chemistry, Indian Institute of Technology, (Banaras Hindu University), Varanasi 221005, Uttar Pradesh, India

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, and

K. D. Mandal

Department of Chemistry, Indian Institute of Technology, (Banaras Hindu University), Varanasi 221005, Uttar Pradesh, India

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https://doi.org/10.1142/S2010135X14500301Cited by:20 (Source: Crossref)

Abstract

Yttrium Copper Titanate (Y_2/3Cu₃Ti₄O₁₂) nanoceramic is structurally analogous to CaCu₃Ti₄O₁₂ (CCTO). X-ray diffraction (XRD) of Y_2/3Cu₃Ti₄O₁₂ (YCTO) shows the presence of all normal peaks of CCTO. SEM micrograph exhibits the presence of bimodal grains of size ranging from 1–2 μm. Bright field TEM image clearly displays nanocrystalline particle which is supported by presence of a few clear rings in the corresponding selected area electron diffraction (SAED) pattern. It exhibits a high value of dielectric constant (ε′ = 8434) at room temperature and 100 Hz frequency with characteristic relaxation peaks. Impedance and modulus studies revealed the presence of temperature-dependent Maxwell–Wagner type of relaxation in the ceramic.

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