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The dielectric studies on sol–gel routed molybdenum oxide thin film

P. Adal Arasu

Department of Physics, St. Joseph’s College, Trichy, India

E-mail Address: mr.adalphysics@gmail.com

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and

R. Victor Williams

Department of Physics, St. Joseph’s College, Trichy, India

E-mail Address: rvwi@yahoo.com

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https://doi.org/10.1142/S2010135X17500114Cited by:25 (Source: Crossref)

Abstract

The influence of temperature on the dielectric properties of sol-gel routed spin-coated molybdenum trioxide (MoO $_{3})$ $_{3})$ thin film has been investigated. Prepared films were annealed at temperatures 250 $^{\circ}$ $^{\circ}$ C, 350 $^{\circ}$ $^{\circ}$ C and 400 $^{\circ}$ $^{\circ}$ C. The phase transformation from amorphous to $α$ $α$ -orthorhombic phase with preferential orientation (0 2 2) has been found by XRD for the film annealed above 250 $^{\circ}$ $^{\circ}$ C. The vibration modes of $α$ $α$ -orthorhombic MoO₃ have been examined by Raman spectrum. The predominant Raman’s band of $α$ $α$ -orthorhombic MoO₃ thin film has been found at the frequency range 1000–600cm $^{- 1}$ $^{- 1}$ . Using the UV–Vis spectrum, the band gap of the film is found to be 3.3–3.8eV. The surface morphology of the MoO₃ films has been examined by scanning electron microscope. The AC conductivity measurement of the MoO₃ film has been carried out in the frequency range 10–10⁶ Hz. The frequency dependence of the impedance has been plotted in the complex plane. The variation of the capacitance and dielectric constant of MoO₃ film with respect to temperature and frequency has been analyzed. Tunability of capacitance and figure of merit of the film are also determined.

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References

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Vol. 07, No. 02

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History

Received 14 February 2017

Revised 29 March 2017

Accepted 1 April 2017

Published: 26 April 2017

Information

This is an Open Access article published by World Scientific Publishing Company. It is distributed under the terms of the Creative Commons Attribution 4.0 (CC-BY) License. Further distribution of this work is permitted, provided the original work is properly cited.

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The dielectric studies on sol–gel routed molybdenum oxide thin film

Abstract

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