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PRECISION MEASUREMENT MEETS ULTRAFAST CONTROL

This work is supported by ONR, AFOSR, NSF, NASA, and NIST

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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S. BLATT

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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M. M. BOYD

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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S. M. FOREMAN

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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T. IDO

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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R. J. JONES

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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A. D. LUDLOW

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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A. MARIAN

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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K. MOLL

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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M. NOTCUTT

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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M. STOWE

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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M. THORPE

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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, and

T. ZELEVINSKY

JILA, National Institute of Standards and Technology and Univ. of Colorado and Department of Physics, University of Colorado, Boulder, Colorado 80309-0440, USA

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https://doi.org/10.1142/9789812701473_0002Cited by:0 (Source: Crossref)

Abstract:

Optical spectroscopy and frequency metrology at the highest level of precision and resolution are being greatly facilitated by the use of ultracold atoms and phase stabilized light in the form of both cw and ultrashort pulses. It is now possible to pursue simultaneously coherent control of quantum dynamics in the time domain and high precision measurements of global atomic structure in the frequency domain. These coherent light-based precision measurement capabilities may be extended to the XUV spectral region, where new possibilities and challenges lie for precise tests of fundamental physical principles.

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PRECISION MEASUREMENT MEETS ULTRAFAST CONTROL

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