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IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL SHIFT MEASUREMENTS USING A POSITION-SENSITIVE CRYSTAL SPECTROMETER FOR PIXE

KUNIKO MAEDA

The Institute of Physical and Chemical Research (RIKEN), Wako-shi, Saitama 351-0198, Japan

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ATSURO TONOMURA

Faculty of Engineering, Hosei University, Koganei-shi, 184-8584, Japan

Present address: GEOL Engineering Co., Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan.

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HIROMI HAMANAKA

Faculty of Engineering, Hosei University, Koganei-shi, 184-8584, Japan

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, and

KENICHI HASEGAWA

Faculty of Engineering, Hosei University, Koganei-shi, 184-8584, Japan

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https://doi.org/10.1142/S0129083501000062Cited by:2 (Source: Crossref)

Abstract

A narrow entrance slit was attached to an in-air high-resolution PIXE system composed of a flat analyzing crystal and a position-sensitive proportional counter. Chemical shift measurements were carried out for Si, P and S Kα_1,2 lines from various sample targets. The precision of measurements is much improved compared with that obtained by the position-sensitive crystal spectrometer system without the entrance slit. The new system equipped with the entrance slit does not require exact sample positioning. It is applicable to non-flat targets. Chemical shift measurements are also possible while moving the targets.

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