APPLICATION OF MICRO-PIXE IN ATMOSPHERIC ENVIRONMENTAL SCIENCE RESEARCH: ELEMENTAL MAP OF LEAVES
Abstract
Micro-beam scanning PIXE and scanning transmission ion microscopy (STIM) were applied to measurement of Siebold's beech (Fagus crenata Blume) leaves. The beech leaf samples were collected from selected beech trees at Tsugaru Pass near the Shirakami-Sanchi World Heritage Area, in the 1999 growing season. We focused our interest on the influence of the atmospheric environment (acidic deposition, aerosol and gaseous substances, etc.) on the forest ecosystem. Our approach to real images of the deposition of airborne particulate on leaves led to the elucidation of the process of elemental absorption from air and plant metabolism. As a result, it is suggested that 1) overlapping STIM images and elemental maps demonstrate the patterns of the elemental absorption into plants, 2) comparison of the elemental maps of leaves taken at the different growth stages may provide useful clues to the elemental accumulation mechanism in leaves, and 3) silicon distribution in leaves is indicative of airborne particulate deposition on them.