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First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission
https://doi.org/10.1142/S0129083519500153Cited by:2 (Source: Crossref)
Abstract
For the first time, particle-induced X-ray emission (PIXE) spectra were obtained using TlBr detectors. The TlBr detector was fabricated from a crystal grown with material purified by the zone purification. Its active volume was 1.5 mm × 1.5 mm × 3.1 mm, and it exhibited an energy resolution of a 6.2 keV full-width at half-maximum (FWHM) for 59.5 keV at room temperature. The detector was installed into a PIXE system at Aomori Prefecture Quantum Science Center. A Pb plate target in the PIXE chamber was irradiated with a 20 MeV proton beam, and X-ray peaks for Pb K and K were successfully detected by the TlBr detector at room temperature.
