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TRACE ANALYSIS OF ALUMINUM METAL REFERENCE STANDARDS BY PIXE METHOD
https://doi.org/10.1142/S0129083592000099Cited by:1 (Source: Crossref)
Abstract
Trace elements in thick samples of aluminum metal reference standards were analyzed by means of PIXE and ICP-AES. The samples were SRM1258 and SRM1259 from National Institute of Standards and Technology (U.S.A.) and 1-A, 3, 4-A and 83 from Japan light metal association. The observed PIXE spectrum was converted “into that of a hypothetical thin target and it was analyzed using a relative intensity database for thin target. A good agreement was obtained between the certified and the found amount of the trace elements. The analytical results for SRM1258 and SRM1259 obtained by ICP-AES method also agreed well with the present results confirming the analytical accuracy.
