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articleNo Access
FABRICATION AND MODELING OF MICROCHANNEL MILLING USING FOCUSED ION BEAM
- A. A. TSENG,
- B. LEELADHARAN,
- B. LI,
- I. INSUA, and
- C. D. CHEN
International Journal of Nanoscience01 Aug 2003
Preview Abstract
The capability of using Focused Ion Beam (FIB) for milling microchannels is experimentally and theoretically investigated. Microchannel structures are fabricated by a NanoFab 150 FIB machine, using an Arsenic (As²⁺) ion source. A beam current of 5 pA at 90 keV accelerating energy is used. Several microchannel patternings are milled at various dwell times at pixel spacing of 14.5 nm on top of a 60 nm gold-coated silicon wafer. An analytical/numerical model is developed to predict the FIB milling behavior. By comparing with the experimental measurements, the model predictions have been demonstrated to be reliable for guiding and controlling the milling processes.

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