This book provides a concise introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. As such, it addresses recent advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science. It covers two of the most popular atomic resolution imaging techniques' namely high-resolution transmission electron microscopy and scanning transmission electron microscopy. The book bridges the gap between application-oriented textbooks in conventional electron microscopy and books in physics covering dedicated topics in charged-particle optics and aberration correction.
The book is structured in three parts which can be read separately. While in the first part the fundamentals of the imaging techniques and their limits in conventional electron microscopes are explained, the second part provides readers with the basic principles of electron optics and the characteristics of electron lenses. The third part, focusing on aberrations, describes the functionality of aberration correctors and provides readers with practical guidelines for the daily work with aberration-corrected electron microscopes. The book represents a detailed and easy readable guide to aberration-corrected electron microscopy.
Sample Chapter(s)
Chapter 1: Introduction (102 KB)
Chapter 2: High-Resolution Transmission Electron Microscopy (772 KB)
Chapter 3: Scanning Transmission Electron Microscopy (573 KB)
Chapter 7: Aberrations (534 KB)
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Contents:
- High-Resolution Transmission Electron Microscopy
- Scanning Transmission Electron Microscopy
- Limits of Conventional Atomic-Resolution Electron Microscopy
- Basic Principles of Electron Optics
- Gaussian Dioptrics
- Aberrations
- Spherical Aberration Correctors
- Aberration-Corrected Imaging
Readership: Advanced undergraduate and graduate students in physics, materials science and related fields; experts and non-experts in electron microscopy.
“Aberration-Corrected Imaging in Transmission Electron Microscopy
is impeccably edited. The schematic diagrams are accurate and informative. The equations presented are necessary and sufficient … Practical aberration-corrected instruments have been a long time coming but are still very expensive. Researchers who are fortunate enough to acquire one should also acquire a copy of Aberration-Corrected Imaging in Transmission Electron Microscopy.”
Physics Today
“It definitely lives up to its promise: carefully written, very knowledgeable, it will enable readers to understand what aberration correction is all about. The account of electron optics that precedes the section on aberration correction is methodical and the treatment of real and asymptotic cardinal elements, often neglected, is exemplary. The account of aberrations and their correction is likewise very thorough. Altogether a useful addition to the bookshelf.”
Ultramicroscopy
“The layout of the text is excellent and I particularly like the fact that the two introductory chapters on HRTEM and STEM stand on their own as introductions to the field that serve as a prelude to an elegant narrative … To the list of essential texts for any student of high-end electron microscopy — make a space on your bookshelf for this book — do it now.”
Infocus
Rolf Erni is head of Electron Microscopy Center, Swiss Federal Laboratories for Materials Testing and Research (Empa), Dübendorf, Switzerland. Previously, he was staff scientist at the National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, USA (2007-2009). Rolf Erni received his doctoral degree from the Swiss Federal Institute of Technology Zurich (ETH Zurich) at the Institute of Applied Physics.