Compound Semiconductor Reliability

The following sections are included:

• MESFETs and HFETs: Mature Technologies

  • Overview

  • Gate sinking

  • Contact degradation

  • Hydrogen poisoning

  • Fluorine dopant passivation

  • Hot-carrier degradation

  • Passivation layer traps

  • Gate-lag effect

• GaAs Heterojunction Bipolar Transistors

  • Basic considerations

  • Degradation in carbon-doped HBTs

  • Sudden DC gain degradation

• SiGe Heterojunction Bipolar Transistors

• Wide Bandgap Semiconductors: SiC and GaN

  • Silicon carbide

  • Gallium nitride

• Summary

• References