Elemental analysis of NIST SRM air particulate on filter media using four different types of PIXE

To confirm the quantitative accuracy of PIXE analysis instruments, we measured NIST SRM air particles on filter media using different types of PIXE analysis instrument: in-air micro-PIXE, in-air PIXE, in-vacuum PIXE, and in-vacuum micro-PIXE. Then, we compared the measured values with certified values and reference values of NIST SRM. We found that the quantitative values of the NIST SRM filter media measured with each PIXE instrument were within 90% to 110% of the NIST-certified and reference values for most elements. In particular, the quantitative values of major elements ranged from 90% to 110% for the in-air PIXE (Kyoto University), the in-vacuum PIXE, and the in-vacuum micro-PIXE at Tohoku University, and the relative errors are also small. These results will aid in determining the quantitative values of atmospheric particles on filter samples.