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NEXAFS SPECTROSCOPY AND MICROSCOPY OF NATURAL AND SYNTHETIC POLYMERS

    https://doi.org/10.1142/9789812775757_0006Cited by:39 (Source: Crossref)
    Abstract:

    The following sections are included:

    • Introduction

    • NEXAFS Spectroscopy

      • Instrument Aspects of NEXAFS and Electron Energy Loss Spectroscopy

      • NEXAFS Spectroscopy of Polymers: Chemical Sensitivity

        • Chemical Sensitivity: Examples

      • NEXAFS Spectroscopy of Polymers: Orientational Sensitivity

      • NEXAFS Spectroscopy of Polymers: Quantitative Analysis

        • Blends of Polycarbonate and Poly(butylene terephthalate)

        • Quantitative Analysis of the Chemical Composition of Polyurethanes

    • NEXAFS Microscopy: Instrumentation and Analysis Tools

      • Quantitative Image Analysis

    • NEXAFS Microscopy: Applications

      • Surfaces and Thin Films

        • Polyimide Films and Surface

        • Overcoats and Lubricating Layers on Hard Disks

        • Confined, Free Standing Homopolymer Thin Films

        • Thin Film Blends

        • Thin Film Polymer Bilayers

        • Block Copolymer Thin Films

      • Bulk Morphology and Composition of Multicomponent, Multiphasic Polymers

        • NEXAFS Microscopy of Poly(ethylene terephthalate)/Vectra™ Blends

        • Engineered Polyurethane Polymers

        • Multilayers

        • Elastomer Composites

      • Fibers

      • Organic Geochemistry

      • Meteoritics and Interplanetary Dust Particles

      • Soils and Environmental Studies

      • Other Applications

    • Summary and Future Outlook

    • Acknowledgments

    • References