X-RAY REFLECTIVITY AND XAFS OF THIN FILMS

The following sections are included:

• Introduction

• X-ray Reflectivity

  • Index on Refraction

  • Reflection from Interfaces

  • The Penetration Depth

• XAFS

  • Basic Principles of EXAFS

  • Detection of XAFS for Thin Films

    • Glancing Angle Techniques

    • Fluorescence Detection

    • Electron Yield Detection

• Experimental Examples

  • Transition Metal/Aluminum Bilayers

  • Total Reflection X-ray Flourescence Spectroscopy

  • Reflectivity Study on Liquid-vapor Interfaces

  • Polarization Dependent XAFS Studies on Thin Hetero-epitaxial Metallic Films

  • In situ MOCVD Growth Studies

• Acknowledgments

• References