FROM THIN FILMS TO SUPERLATTICES STUDIED WITH X-RAYS AND NEUTRONS

The use of x-ray and neutron diffraction techniques in the study of thin films and superlattices is discussed with reference to specific examples. Advances in x-ray scattering, and in particular the ability to perform x-ray magnetic scattering experiments, means that it is timely to assess the relative merits of the two techniques. The examples are chosen to illustrate the type of detailed information that can be obtained on systems ranging from thin films up to superlattices. It is shown in particular how high-resolution x-ray scattering is particularly well suited to the study of these artificial structures.