Search
This Journal
This Journal
Anywhere
Quick Search in Journals
Enter words / phrases / DOI / ISBN / keywords / authors / etc
Access type:Only show content I have full access toOnly show Open Access
Advanced Search
0 My Cart
Sign in
Institutional Access

System Upgrade on Tue, May 28th, 2024 at 2am (EDT)

Existing users will be able to log into the site and access content. However, E-commerce and registration of new users may not be available for up to 12 hours.
For online purchase, please visit us again. Contact us at customercare@wspc.com for any enquiries.

1. Fundamental Aspects and Technical Development of PIXENo Access

STUDY OF THE APPLICATION OF PSS AT SYNCHROTRON RADIATION

Institute of High Energy Physics, Yuqian Lu 19, Beijing 100039, The People's Republic of China

Search for more papers by this author

,

Institute of High Energy Physics, Yuqian Lu 19, Beijing 100039, The People's Republic of China

Search for more papers by this author

,

Institute of High Energy Physics, Yuqian Lu 19, Beijing 100039, The People's Republic of China

Search for more papers by this author

,

Institute of High Energy Physics, Yuqian Lu 19, Beijing 100039, The People's Republic of China

Search for more papers by this author

,

Institute of High Energy Physics, Yuqian Lu 19, Beijing 100039, The People's Republic of China

Search for more papers by this author

,

J. Stefan Institute, Jamova 39, p.p. 3000, SI-1001 Ljubljana, Slovenia

Search for more papers by this author

,

PRIMOŽ PELICON

J. Stefan Institute, Jamova 39, p.p. 3000, SI-1001 Ljubljana, Slovenia

Search for more papers by this author

, and

MATJAŽ KAVČIČ

J. Stefan Institute, Jamova 39, p.p. 3000, SI-1001 Ljubljana, Slovenia

Search for more papers by this author

https://doi.org/10.1142/S0129083502000184Cited by:0 (Source: Crossref)

Abstract

The paper presents the verification of home made Position Sensitive Spectrometer (PSS) while using synchrotron radiation light (SRL) as an excitation source. When Cr in the substance of light base was analyzed by the PSS, the lowest detection limit of a few ppm was achieved. Also linear proportionality between the count rate of the PSS and Cr concentration was obtained. This verities the feasibility of trace element analysis with high-energy resolution when using the PSS. At measurement of Cr Kβ₅ band in metallic Cr and its compounds, it was discerned that the intensity of Cr Kβ₅ becomes more intense with increasing oxidation number of Cr compounds. Such a change shows that high-energy resolution analysis using the PSS can make a useful method for the study of chemical states.

Keywords:

References

K. Tsutsumi, J. Phy. Soc. Of Japan 12, 1696 (1959). Web of Science, Google Scholar
K. Tsutsumi and H. Nakamori, J. Phy. Soc. Of Japan 25, 1418 (1968), DOI: 10.1143/JPSJ.25.1418. Crossref, Web of Science, Google Scholar
K. Tsutsumi, H. Nakamori and K. Ichikawa, Phy. Rev. B 13, 929 (1976), DOI: 10.1103/PhysRevB.13.929. Crossref, Web of Science, Google Scholar
B. Ekstiget al., Electron Interaction in Transition Metal X-ray Emission Spectra 2, 38 (1970). Google Scholar
David W. Fischer, J. Appl. Phys. 41(9), 3561 (1970), DOI: 10.1063/1.1659472. Crossref, Web of Science, Google Scholar
David W. Fischer, Phys. Rev. B 5, 4219 (1972), DOI: 10.1103/PhysRevB.5.4219. Crossref, Web of Science, Google Scholar
D. S. Urch and P. R. Wood, X-Ray Spectrometry 7, 9 (1978), DOI: 10.1002/xrs.1300070105. Crossref, Web of Science, Google Scholar
V.-P. Tanninenet al., X-RAY SPECTROMETRY 14(4), 188 (1985), DOI: 10.1002/xrs.1300140410. Crossref, Web of Science, Google Scholar
U. Bergmannet al., J. Phys. Chem. B 102, 8350 (1998), DOI: 10.1021/jp982038s. Crossref, Web of Science, Google Scholar
F. Folkmann, Nucl. Instr. Meth. B 75, 9 (1993), DOI: 10.1016/0168-583X(93)95600-A. Crossref, Web of Science, Google Scholar
J. Hoszowska and J.-Cl. Dousse, J. Phys. B: Mol. Opt. Phys. 29, 1641 (1996), DOI: 10.1088/0953-4075/29/9/011. Crossref, Web of Science, Google Scholar
M. Budnaret al., Intr. J. of PIXE 6, 51 (1996), DOI: 10.1142/S0129083596000065. Link, Google Scholar
Y. Mokunoet al., Nucl. Instr. Meth. B 130, 243 (1997), DOI: 10.1016/S0168-583X(97)00171-7. Crossref, Web of Science, Google Scholar
K. Maedaet al., Nucl. Instr. Meth. B 136–138, 994 (1998). Crossref, Web of Science, Google Scholar
K. Maedaet al., Intr. J. of PIXE 10, 47 (2000), DOI: 10.1142/S0129083500000079. Link, Google Scholar
K. Kawatsuraet al., Nucl. Instr. Meth. B 181, 128 (2001), DOI: 10.1016/S0168-583X(01)00593-6. Crossref, Web of Science, Google Scholar
K. Maeda, H. Hamanaka and K. Hasegawa, Inter. J of PIXE 6, 97 (1996), DOI: 10.1142/S0129083596000119. Link, Web of Science, Google Scholar
D. H. Morseet al., Nucl. Instr. Meth. B 99, 427 (1995), DOI: 10.1016/0168-583X(94)00636-9. Crossref, Web of Science, Google Scholar
A. Ektessabiet al., X-Ray Spectrometry 30, 44 (2001), DOI: 10.1002/xrs.466. Crossref, Web of Science, Google Scholar
S. Hashimotoet al., X-Ray Spectrometry 30, 116 (2001), DOI: 10.1002/xrs.476. Crossref, Web of Science, Google Scholar
Hu Zhaohuiet al., Inter. J of PIXE 9, 125 (1999). Web of Science, Google Scholar
Mitja Uršič, Diploma work, University of Ljubljana, Slovenia, 2001 . Google Scholar

Journal cover image

Vol. 12, No. 03n04

Metrics

Downloaded 11 times

History

Received 16 April 2002

Keywords