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DIAGNOSIS OF SPATIAL RESOLUTION FOR MICROBEAM SCANNING PIXE USING STIM METHOD AND CR-39 TRACK DETECTOR IN PASTA

T. Hamano

National Institute of Radiological Sciences, 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan

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H. Imaseki

National Institute of Radiological Sciences, 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan

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M. Yukawa

National Institute of Radiological Sciences, 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan

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T. Ishikawa

National Institute of Radiological Sciences, 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan

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H. Iso

Neosteck Co., 4-9-1 Anagawa, Inage-ku, Chiba 263-8555, Japan

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, and

K. Matsumoto

Department of Physics, Toho University, 2-2-1 Miyama, Funabashi 274-8510, Japan

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https://doi.org/10.1142/S0129083503000087Cited by:5 (Source: Crossref)

Abstract

In PIXE analysis system and Tandem Accelerator facility (PASTA) of NIRS, we are using Scanning Transmission Ion Microscopy (STIM) method and solid track detector to diagnose the spatial resolution of scanning microbeam PIXE analysis system. These methods are widely used by many microbeam facilities.

Keywords:

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