EVALUATION OF THIN SECTION STANDARDS FOR LOCAL ANALYSIS OF LIGHT ELEMENTS BY MICRO-PIXE ANALYSIS
Abstract
For quantitative measurements of light elements by micro-PIXE (particle-induced X-ray emission) analysis, suitable external standards have been expected. In this paper thin sections of polyvinyl alcohol solution containing phosphorus (P) and potassium (K) were assessed for their purpose as standards by micro-PIXE analysis. Homogeneity of P and K added to the standard materials were validated by 1 μm and 10 μm-step scanning of the standard. The relative standard deviations of the X-ray intensity of the standards P and K were < 25% and <16%, respectively. The calibration line between the X-ray intensity obtained from a 100 × 100 μm2 area and the elements concentration was also acceptable, indicating that the thin section standards are adequate for an external standard of micro-PIXE measurements for light elements.
