Development of a Submilli-PIXE Camera
Abstract
We developed a PIXE analysis system which provides spatial distribution images of elements in a region of several cm2 with a spatial resolution of < 0.5 mm. We call this system a submilli-PIXE camera. This system consists of a submilli-beam line, beam scanners and a data acquisition system in which the X-ray energy and the beam position are simultaneously measured. We demonstrate the usefulness of the submilli-PIXE camera by analyzing the surface of a shell and of granite.