Optimized Growth of ZnO Nanowires and Nanorods Using MOCVD
Abstract
ZnO NWs were grown on Si (111) and Al2O3 substrates using MOCVD. ZnO (002) NWs on Si were randomly orientated while the NWs grown on sapphire were mostly vertically aligned as evident from scanning electron microscope images. The c-axis lattice constant corresponding to ZnO (002)/Si(111) demonstrated a dominant peak at 34.47°(2θ) attributed to ZnO along (002) with a FHWM of 0.0948°(θ) with corresponding c and a-lattice axes constants of 5.1996Å and 3.2456Å, respectively. The c-axis lattice constant for ZnO/sapphire was estimated to be 5.205Å resulting in an out of plane strain of only 0.03%. Photoluminescence of ZnO nanowires grown on sapphire shows absorption peaks associated to exciton-exciton recombination and native defect such as zinc interstitial. In the case of NWs grown on Si, only exciton to exciton recombination was observed.
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