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Structural-phase transition in (Cu2Te)2x(ZnTe)x at high temperature

    https://doi.org/10.1142/S0217979221501137Cited by:10 (Source: Crossref)

    Cu2Te single crystal was grown by the Bridgman method. X-ray diffraction (XRD) study of Cu2Te single crystals in the temperature range of 293–893 K was performed and possible phase transitions in the mentioned range of temperature have been investigated. (Cu2Te)2x(ZnTe)x single crystals also were grown with x=0.00, 0.05, 0.10 concentrations and structural properties of the obtained single crystals were investigated by the XRD method in the temperature range 293–893 K. Lattice parameters and possible phase transitions in the mention temperature range were determined for (Cu2Te)2x(ZnTe)x single crystals for x=0.00, 0.05, 0.10 concentrations.

    PACS: 01.65.+g, 61.50.Ks, 64.70.Kb
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