A novel area-efficient switching scheme is proposed for the successive approximation register (SAR) analog-to-digital converters (ADCs). The capacitor-splitting structure, charge-average switching technique, and Vaq (equal to VREF/4) are combined together and optimized to realize the proposed switching scheme. Vaq is only used in the last two bit cycles, which affects the ADC accuracy little and reduces capacitor area by half. It achieves a 98% less switching energy and an 87.5% less capacitor area compared with the conventional switching method. In addition, the DAC output common-mode voltage is approximately constant. Thus, the proposed switching method is a good tradeoff among power consumption, capacitor area, DAC output common-mode voltage, and ADC accuracy. The proposed SAR ADC is simulated in 0.18μm CMOS technology with a supply voltage of 0.6V and at a sampling rate of 20kS/s. The signal-to-noise-distortion ratio (SNDR) and spurious free dynamic range (SFDR) are 58.2 and 73.7dB, respectively. The effective number of bits (ENOB) is 9.4. It consumes 42nW, resulting in a figure-of-merit (FoM) of 3.11 fJ/conversion-step.