Please login to be able to save your searches and receive alerts for new content matching your search criteria.
Si K x-ray spectra in SiO2-Na2O were measured with a double-crystal spectrometer. Remarkable change of peak energy, FWHM and intensity were found, depending on sodium contents. Theoretical spectra of Si Kβ x-ray were calculated to explain the change of x-ray intensity.
In the contribution the high-resolution X-ray spectrometer, originally constructed for the atomic physics research, is presented. Test measurements of Lβ and Lγ intensity ratios on In and Te compounds were performed. The applicability of the spectrometer for detection of chemical effects in X-ray spectra of compounds is discussed.