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Computational Nanocharacterization for Combinatorially Developed Bulk Metallic Glass
Preview AbstractBulk metallic glasses synthesized at specialized facilities at Yale using magnetron cosputtering are sent to Southern Connecticut State University for elemental characterization. Characterization is done using a Zeiss Sigma VP SEM coupled with an Oxford EDS. Characterization is automated using control software provided by Oxford. Collected data is processed and visualized using computational methods developed internally. Processed data is then organized into a database suitable for web retrieval. This technique allows for the rapid characterization of a combinatorial wafer to be carried out in ~11 hours for a single wafer containing ~600 unique compounds.