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  • articleNo Access

    A FEW APPROACHES TO REMOVE AMBIGUOUS FACTORS IN X-RAY SPECTRUM ANALYSIS

  • articleFree Access

    A pile-up correction algorithm for STCF ECAL readout electronics

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    FINITE ELEMENT ANALYSIS OF THERMAL NANOINDENTATION PROCESS AND ITS EXPERIMENTAL VERIFICATION

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    RECENT STUDY ON THE RELATED PROBLEMS IN EVALUATION OF MECHANICAL PROPERTIES FOR MEMS MATERIALS

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    FINITE ELEMENT ANALYSIS OF THERMAL NANOINDENTATION PROCESS AND ITS EXPERIMENTAL VERIFICATION

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    Evolution of the response of the CMS ECAL and upgrade design options for electromagnetic calorimetry at the HL-LHC