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  • articleNo Access

    INVESTIGATION ON THE INFLUENCE OF BACK SCATTERED PROTONS IN PIXE SPECTRUM

    The pre-amplifier with an active reset system was examined to carry out PIXE analysis under the condition that X-rays and back scattered protons are detected simultaneously. Rejection of false signals produced by back scattered protons is discussed, and it is confirmed that false signals can be completely rejected by using an inhibit signal of the preamplifier. Energy resolution of an X-ray detector and a live-time of measurement system were measured as a function of counting rate. As a result, energy resolution did not change and the live-time was 70 % at the high counting rate over 3kcps. The pile-up effect on the X-ray signal with the proton signal tail is also discussed.

  • articleNo Access

    Design and Analysis of Low Power and High-Speed Dynamic Comparator with Transconductance Enhanced in Latching Stage for ADC Application

    The increasing demand for low voltage, power efficient, high-speed analog-to-digital converters (ADCs) results in the improvement of speed and power of regenerative dynamic comparator. In this paper, a dual-tail dynamic comparator is used with two extra transistors in the latch stage. These extra transistors help in the increase of transconductance of the latch stage, which helps decrease the delay of the proposed comparator. Mathematical analysis is done for the proposed architecture; this gives the idea of reducing the delay of the comparator with an increase in the transconductance of the comparator. The simulation and layout of the proposed comparator are done on the Cadence software with 90nm CMOS technology. This proposed design is simulated with a 2GHz clock frequency at supply voltage of 1V. The proposed architecture consumes a power of 39.19μW and a delay of 143.12ps at 1V supply voltage, 5mV input difference voltage and 0.9V common mode voltage. The Monte Carlo simulation of the proposed architecture for power, delay, power delay product (PDP) and offset is also demonstrated in this paper. Process corner analysis is done for power, delay and PDP.

  • chapterNo Access

    LOW-NOISE MEASUREMENTS OF SMALL CURRENTS AND VOLTAGES FOR CHARACTERIZATION OF SEMICONDUCTOR NANOSTRUCTURES AT LOW TEMPERATURES

    Measuring small currents and voltages with high precision in the presence of noise is challenging. However, many applications in modern solid state physics require smallest excitations in the range of nanovolt and picoampere to investigate intriguing quantum effects in nano structures. We developed a series of pre-amplification and signal-conditioning systems to allow high quality measurements of such signals with emphasis on multi-channel applications as well as signal clarity.