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Independent component analysis (ICA) does not follow the superposition rule. This motivates us to study a negative event-related potential — mismatch negativity (MMN) estimated by the single-trial based ICA (sICA) and averaged trace based ICA (aICA), respectively. To sICA, an optimal digital filter (ODF) was used to remove low-frequency noise. As a result, this study demonstrates that the performance of the sICA+ODF and aICA could be different. Moreover, MMN under sICA+ODF fits better with the theoretical expectation, i.e., larger deviant elicits larger MMN peak amplitude.

We present a systematic and straightforward approach to the problem of single-trial classification of event-related potentials (ERP) in EEG. Instead of using a generic classifier off-the-shelf, like a neural network or support vector machine, our classifier design is guided by prior knowledge about the problem and statistical properties found in the data. In particular, we exploit the well-known fact that event-related drifts in EEG potentials, albeit hard to detect in a single trial, can well be observed if averaged over a sufficiently large number of trials. We propose to use the average signal and its variance as a generative model for each event class and use Bayes' decision rule for the classification of new and unlabeled data. The method is successfully applied to a data set from the NIPS*2001 Brain–Computer Interface post-workshop competition. Our result turned out to be competitive with the best result of the competition.