Narrow Results

The star images obtained through the CCD camera can visually display the star structure. In order to get the wide starry image, we need to extract the characteristics of star images to achieve the star image stitching. In the star images, star points, whose characteristics are limited, are easily influenced by noise and are also difficult to extract. The number of stars is too large to stitch accurately. Thus, we propose a stitching algorithm based on blocking star images. First, we establish the maximum intensity projection model based on time sequence to locate the star points accurately. Then, according to the relative positions of star points, the block model is introduced to realize the establishment of the characteristics. Finally, the star image stitching is achieved from the perspective of the characteristic similarity. The experiments illustrate that CM (combination measure) reaches 0.87, and the proposed algorithm has better anti-noise performance and robustness.

This paper presents an approach to the registration of individual images to one another to produce a larger composite mosaic. The approach is based on the use of the moments of Zernike orthogonal polynomials to compute the relative scale, rotation and translation between the images. A preliminary stage involves the use of an attention-like operation to estimate potential approximate correspondence points between the images based on extrema of local edge element density. Experimental results illustrate that the technique is effective in a range of environments and over a broad range of image registration parameters. In particular, our method makes few assumptions regarding the image content and yet, unlike several alternative approaches, can perform registration for images with only a limited amount of overlap.

The basic study of EPL has been done under the name of SCALPEL^® by AT&T (Lucent Technologies, then Agere Systems) from the beginning of 1990s and the name of PREVAIL for electron optical system by the joint work of IBM and Nikon. The features of EPL are larger sub-field size and higher acceleration voltage of electron for obtaining usable higher electrical current on wafer and a wide deflection width for obtaining higher throughput.

EPL system has such features as a large sub-field size, large deflection width, high electrical current, high acceleration voltage and thin Si stencil mask. EPL has been considered as one of the promising technologies for hp65nm node and beyond.

Nikon has developed the first EPL tool and it was delivered to Selete in Japan. The tool has been used for EPL technology evaluation and process development in the pilot line of Selete. This chapter describes the various aspects of EPL technology from basic concept through technology evaluation and future extendibility.

This paper presents an approach to the registration of individual images to one another to produce a larger composite mosaic. The approach is based on the use of the moments of Zernike orthogonal polynomials to compute the relative scale, rotation and translation between the images. A preliminary stage involves the use of an attention-like operation to estimate potential approximate correspondence points between the images based on extrema of local edge element density. Experimental results illustrate that the technique is effective in a range of environments and over a broad range of image registration parameters. In particular, our method makes few assumptions regarding the image content and yet, unlike several alternative approaches, can perform registration for images with only a limited amount of overlap.

We demonstrate a method, sub-intensity pattern stitching, to extend the amplitude measurement range of wavefront in phase retrieval. An algorithm based on least square to stitch is presented. An experimental setup used to measure a spherical mirror with 100mm diameter and 650mm radius using this stitching method is arranged. The stitching results and corresponding interferometer results are in excellent agreement, which promises the validity of this method.