This monograph provides detailed background on the image processing problems encountered in the food industry when automatic control and inspection systems are being designed and installed. It starts with a careful study of image processing and machine vision methodology, and then goes on to analyse how this can be applied in the main areas of food processing and production. A case study approach is used to give relevance to the work, making the book user-friendly.
This book will help the food industry to observe 'due diligence', and researchers to be more aware of the problems of analysing images of food products.
Contents:
- Image Processing Methodology:
- Images and Image Processing
- Shape Analysis
- Feature Detection and Object Location
- Texture
- Three-Dimensional Processing
- Pattern Recognition
- Application to Food Production:
- Inspection and Inspection Procedures
- Inspection of Baked Products
- Cereal Grain Inspection
- X-Ray Inspection
- Image Processing in Agriculture
- Vision for Fish and Meat Processing
- System Design Considerations
- Food Processing for the Millennium
Readership: Researchers and practitioners in image processing and computer vision.
E R Davies graduated from Oxford University in 1963 with a first class honours degree in Physics. After 12 years' research in solid state physics, his interests in electronic data processing led him to Royal Holloway, University of London, where he is now Professor of Machine Vision. He has worked on the theory of image processing and on many core techniques for feature location and robust pattern matching, and has had considerable experience in algorithm design for automated visual inspection, particularly for the food industry. He has published two books — Electronics, Noise and Signal Recovery (1993) and Machine Vision: Theory, Algorithms, Practicalities (1997) — and more than 150 research papers, and was recently awarded a Doctor of Science degree by the University of London for his work on the science of measurement. Professor Davies is a regular reviewer for many image processing journals, and is on the editorial boards of Imaging Science, Pattern Recognition Letters and Real-Time Imaging. He is a Fellow of the Institute of Physics and the Institution of Electrical Engineers, and a Senior Member of the IEEE. He has taught courses on pattern recognition, image processing and machine vision for over 20 years.