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On-Line Analysis of Stuck-at Faults in On-Chip Network Interconnects
Preview AbstractReliability has become a major concern when link-wires in on-chip networks (NoCs) suffer from stuck-at faults (SAFs). This paper presents an extended and scalable test scheme that addresses these faults in NoC links to improve yield and reliability. The scheme detects the stuck-at faults on and identifies faulty link-wires. Experiments demonstrate the effectiveness of the proposed scheme and reveal deep insights of the faults on several performance metrics.