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ACCURACY ISSUES OF ON-WAFER MICROWAVE NOISE MEASUREMENTS

CHIH-HUNG CHEN

Department of Electrical and Computer Engineering, McMaster University, 1280 Main Street West, Hamilton, Ontario, L8S 4K1, Canada

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https://doi.org/10.1142/S0219477508005136Cited by:2 (Source: Crossref)

Abstract

The accuracy issues of on-wafer noise characterization for a linear noisy two-port are presented in this paper. It starts with the description of a microwave noise measurement system and the possible source of error due to the microwave power meter in the measurement system. With the description of noise characterization techniques, this paper reviews a couple of methods for noise parameter extraction to handle the errors in the measured noise powers, noise factors, and source admittances. It also presents the methods to extract the physical noise parameters and to take care of different source admittances in the hot and cold states for accuracy enhancement.

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