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Special Issue on 23^rd Connecticut Microelectronics and Optoelectronics Consortium Symposium (CMOC-2014) April 9, Connecticut, USA; Edited by F. Jain, C. Broadbridge and H. TangNo Access

Computational Nanocharacterization for Combinatorially Developed Bulk Metallic Glass

Eric M. Gossett

Department of Physics, Southern Connecticut State University (SCSU), 501 Crescent St. New Haven, CT 06515, USA

Connecticut State Colleges and Universities Center for Nanotechnology (ConnSCU-CNT), SCSU, New Haven, CT 06515, USA

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Ellen B. Scanley

Department of Physics, Southern Connecticut State University (SCSU), 501 Crescent St. New Haven, CT 06515, USA

Connecticut State Colleges and Universities Center for Nanotechnology (ConnSCU-CNT), SCSU, New Haven, CT 06515, USA

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Center for Research on Interface Structures and Phenomena (CRISP), Yale University/SCSU, New Haven, CT 06515, USA

Department of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06515, USA

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Center for Research on Interface Structures and Phenomena (CRISP), Yale University/SCSU, New Haven, CT 06515, USA

Department of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06515, USA

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Center for Research on Interface Structures and Phenomena (CRISP), Yale University/SCSU, New Haven, CT 06515, USA

Department of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06515, USA

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Center for Research on Interface Structures and Phenomena (CRISP), Yale University/SCSU, New Haven, CT 06515, USA

Department of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06515, USA

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Center for Research on Interface Structures and Phenomena (CRISP), Yale University/SCSU, New Haven, CT 06515, USA

Department of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06515, USA

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Christine Broadbridge

Department of Physics, Southern Connecticut State University (SCSU), 501 Crescent St. New Haven, CT 06515, USA

Connecticut State Colleges and Universities Center for Nanotechnology (ConnSCU-CNT), SCSU, New Haven, CT 06515, USA

Center for Research on Interface Structures and Phenomena (CRISP), Yale University/SCSU, New Haven, CT 06515, USA

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Todd C. Schwendemann

Department of Physics, Southern Connecticut State University (SCSU), 501 Crescent St. New Haven, CT 06515, USA

Connecticut State Colleges and Universities Center for Nanotechnology (ConnSCU-CNT), SCSU, New Haven, CT 06515, USA

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https://doi.org/10.1142/S0129156415200128Cited by:0 (Source: Crossref)

Abstract

Bulk metallic glasses synthesized at specialized facilities at Yale using magnetron cosputtering are sent to Southern Connecticut State University for elemental characterization. Characterization is done using a Zeiss Sigma VP SEM coupled with an Oxford EDS. Characterization is automated using control software provided by Oxford. Collected data is processed and visualized using computational methods developed internally. Processed data is then organized into a database suitable for web retrieval. This technique allows for the rapid characterization of a combinatorial wafer to be carried out in ~11 hours for a single wafer containing ~600 unique compounds.

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Vol. 24, No. 03n04

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Downloaded 28 times

History

Received 15 March 2015

Accepted 16 July 2015

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