World Scientific
Skip main navigation

Cookies Notification

We use cookies on this site to enhance your user experience. By continuing to browse the site, you consent to the use of our cookies. Learn More
×

System Upgrade on Tue, May 28th, 2024 at 2am (EDT)

Existing users will be able to log into the site and access content. However, E-commerce and registration of new users may not be available for up to 12 hours.
For online purchase, please visit us again. Contact us at customercare@wspc.com for any enquiries.

Automation Software for Semiconductor Research Laboratories: Electrical Parameter Calculation Program (SeCLaS-PC)

    https://doi.org/10.1142/S0218126620502151Cited by:11 (Source: Crossref)

    We prepared a simple program for basic electrical measurements and parameter extraction from these measurements of metal–semiconductor (MS) contacts. In this paper, we introduce a basic electrical parameter calculation software (SeCLaS-PC) for semiconductor laboratories from the temperature-dependent/independent current–voltage (IV), capacitance– voltage (CV) and capacitance–frequency (Cf) measurement results. SeCLaS-PC program was developed using Keysight VEE Pro (Visual Engineering Environment) software and the program has a user-friendly graphical interface. More than 50 device parameters can be easily obtained, using different methods, from the Cf, temperature-dependent IV and temperature-dependent CV measurement results for one device, with our SeCLaS-PC program.

    This paper was recommended by Regional Editor Emre Salman.