In this paper, for the first time, changes in the effective mass (EM) of electron and hole with mole fraction are taken into account for extracting the benchmarking parameters of analog/radio frequency (RF) and high-frequency noise performance of junctionless (JL)-GaxIn1−xAs/GaAs via simulation. In the JL-GaxIn1−xAs/GaAs structure, considering changes in the effective mass with mole fraction is called a with-EM state, while the JL-GaxIn1−xAs/GaAs structure without considering the changes in effective mass with mole fraction is called a without-EM state. The simulation results show that, per x=0.5, the maximum transconductance in the with-effective mass (EM) state is Gm,max=2.3 mS/μm, which is reduced by 8% compared to the without-EM state. The JL-Ga0.5In0.5As/GaAs device in the with-EM state has the unity gain cutoff frequency of fT=900 GHz, minimum noise figure of Nf,min=0.29 db, and available associated gain of Gass=23.84 db. The fT and Gass parameters in the with-EM state decreased by 10% and 38%, respectively, compared to the without-EM state. Moreover, Nf,min in the with-EM state increased by 65% compared to the without-EM state. Our simulation results indicated that an increase in electron effective mass with the increased x can limit the analog/RF frequency and high-frequency noise performance of the JL-GaxIn1−xAs/GaAs device.