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articleNo Access
APPLICATION OF PIXE- AND RBS-CHANNELING TO INVESTIGATIONS ON THE CHARACTERIZATION OF SINGLE CRYSTAL STAINLESS STEEL
- T. NAKAE,
- R. TAKAHASHI,
- T. NOMURA,
- Y. NAKAI,
- H. KAGEYAMA,
- N. SHIMATANI,
- T. AWATA,
- A. NISHIHATA,
- S. ARAI,
- K. KAWATSURA,
- Y. HORINO,
- Y. MOKUNO,
- K. FUJII,
- Y. AOKI,
- H. TAKESHITA,
- S. YAMAMOTO,
- P. GOPPELT-LANGER,
- H. NARAMOTO,
- T. MITAMURA,
- M. TERASAWA,
- H. UCHIDA, and
- K. KOTERAZAWA
International Journal of PIXE01 Jan 1994
Preview Abstract
The characterization of the single crystal of type 304 stainless steels was performed by using particle induced x-ray emission and Rutherford backscattering spectroscopy with channeling technique (PIXE-C and RBS-C). They proved that the solution annealing process is absolutely necessary for production of a good single crystal of stainless steels.
They are also shown that the positions of P atoms before He irradiation were mostly substitutional sites of fcc structure and that MeV He ion irradiation induced segregation of Si and S atoms to the (110) surface.

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